ESD is a crucial factor for integrated circuits and influences their quality and reliability.
Today increasingly sensitive processes with deep sub micron structures are developed. The
integration of more and more functionality on a single chip and saving of chip area is
required. Integrated circuits become more susceptible to ESD/EOS related damages.
However, the requirements on ESD robustness especially for automotive applications are
increasing. ESD failures are very often the reason for redesigns. Much research has been
conducted by semiconductor manufacturers on ESD robust design.
