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  • Ps_2 keyboard application with 8051 proteus simulation

    Ps_2 keyboard application with 8051 proteus simulation

    标签: application simulation keyboard proteus

    上传时间: 2013-09-25

    上传用户:a67818601

  • LTC1099基于PC的数据采集板实现

    A complete design for a data acquisition card for the IBM PC is detailed in this application note. Additionally, C language code is provided to allow sampling of data at speed of more than 20kHz. The speed limitation is strictly based on the execution speed of the "C" data acquisition loop. A "Turbo" XT can acquire data at speeds greater than 20kHz. Machines with 80286 and 80386 processors can go faster than 20kHz. The computer that was used as a test bed in this application was an XT running at 4.77MHz and therefore all system timing and acquisition time measurements are based on a 4.77MHz clock speed.

    标签: 1099 LTC 数据 采集板

    上传时间: 2013-10-29

    上传用户:BOBOniu

  • DAC技术用语 (D/A Converters Defini

    Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.

    标签: Converters Defini DAC

    上传时间: 2013-10-30

    上传用户:stvnash

  • ADC转换器技术用语 (A/D Converter Defi

    ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.

    标签: Converter Defi ADC 转换器

    上传时间: 2013-11-12

    上传用户:pans0ul

  • Switch-Mode Power Supply Simulation^Designing with SPICE 3(英文高清)

    开关电源类书籍:Switch-Mode Power Supply Simulation^Designing with SPICE 3.pdf ·

    标签: Switch-Mode Simulation Designing Supply

    上传时间: 2013-11-20

    上传用户:aa17807091

  • 超级电容器备用电源系统的手持设备数据保护

      Handheld electronic devices play a key role in our everydaylives. Because dependability is paramount, handhelds arecarefully engineered with lightweight power sources forreliable use under normal conditions. But no amount ofcareful engineering can prevent the mistreatment theywill undergo at the hands of humans. For example, whathappens when a factory worker drops a bar code scanner,causing the battery to pop out? Such events areelectronically unpredictable, and important data storedin volatile memory would be lost without some form ofsafety net—namely a short-term power holdup systemthat stores suffi cient energy to supply standby power untilthe battery can be replaced or the data can be stored inpermanent memory.

    标签: 超级电容器 备用电源 手持设备

    上传时间: 2013-11-05

    上传用户:coeus

  • 1 MIMO-OFDM Wireless Communications with MATLAB

    多输入多输出无线传感器之matlab应用研究,1 MIMO-OFDM Wireless Communications with MATLAB。

    标签: Communications MIMO-OFDM Wireless MATLAB

    上传时间: 2013-11-05

    上传用户:zhangfx728

  • DS8005评估套件入门

    Abstract: This application note describes how to build, debug, and run applications on the on-board MAXQ622microcontroller to interface with the DS8005 dual smart card interface. This is demonstrated in both IAREmbedded Workbench and the Rowley CrossWorks IDE, using sample code provided with the kit.

    标签: 8005 DS 评估套件

    上传时间: 2013-10-29

    上传用户:ddddddd

  • Atmel AT89C系列单片机电路板设计指南

    Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test. Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.  

    标签: Atmel 89C AT 89

    上传时间: 2013-11-17

    上传用户:xiaozhiqban

  • AVR常用库函数介绍

    目录: 1. Character Type Functions - 字符类型函数 2. Standard C Input/Output Functions - 标准输入输出函数 3. Standard Library Functions - 标准库和内存分配函数 4. Mathematical Functions - 数学函数 5. String Functions - 字符串函数 6. BCD Conversion Functions - BCD 转换函数 7. Memory Access Functions - 存储器访问函数 8. Delay Functions - 延时函数 9. LCD Functions - LCD函数 10. LCD Functions for displays with 4x40 characters - 4×40 字符型LCD函数 11. LCD Functions for displays connected in 8 bit memory mapped mode -以8 位外部存储 器模式接口的LCD显示函数 12. I2C Bus Functions - I2C 总线函数 13. National Semiconductor LM75 Temperature Sensor Functions - LM75 温度传感器函数 14. Dallas Semiconductor DS1621 Thermometer/Thermostat Functions - DS1621 温度计函 数 15. Philips PCF8563 Real Time Clock Functions - PCF8563 实时时钟函数 16. Philips PCF8583 Real Time Clock Functions - PCF8583 实时时钟函数 17. Dallas Semiconductor DS1302 Real Time Clock Functions - DS1302 实时时钟函数 18. Dallas Semiconductor DS1307 Real Time Clock Functions - DS1307 实时时钟函数 19. 1 Wire Protocol Functions - 单线通讯协议函数 20. Dallas Semiconductor DS1820/DS1822 Temperature Sensors Functions - DS1820/1822 温度传感器函数 21. SPI Functions - SPI 函数 22. Power Management Functions - 电源管理函数 23. Gray Code Conversion Functions - 格雷码转换函数

    标签: AVR 库函数

    上传时间: 2013-10-22

    上传用户:归海惜雪