UNIX下的threat源程序文件，可以很好学习线程概念
上传时间： 2015-08-04
上传用户：weiwolkt
CO2 increases anywhere are a threat to the future of civiliza-tion everywhere, Gore in Oslo 10/7/07
标签： civiliza-tion everywhere increases anywhere
上传时间： 2017-08-11
上传用户：dongbaobao
CO2 increases anywhere are a threat to the future of civiliza-tion everywhere, Gore in Oslo 10/7/07
标签： civiliza-tion everywhere increases anywhere
上传时间： 2014-03-06
上传用户：anng
Abstract: The rapid build out of today's smart grid raises a number of security questions. In this article,we review two recent well-documented security breaches and a report of a security gap. These situationsinclude a 2009 smart-meter hack in Puerto Rico; a 2012 password discovery in grid distributionequipment; and insecure storage of a private key in distribution automation equipment. For each of theseattacks, we examine the breach, the potential threat, and secure silicon methods that, as part of acomplete security strategy, can help thwart the attacks.
上传时间： 2013-10-27
上传用户：tecman
Complete coverage of all four CCNP exams: ? EIGRP, OSPF, IS-IS, and BGP ? Optimizing routing ? IP multicast ? IPv6 ? VLAN implementation ? Spanning Tree ? InterVLAN routing ? Layer 3 redundancy ? Wireless LANs ? VoIP in campus networks ? Campus network security ? Frame-mode MPLS ? IPsec ? Cisco device hardening ? Cisco IOS? threat defenses ? Cisco VoIP ? QoS and AutoQoS ? Wireless scalability
标签： Optimizing Complete coverage routing
上传时间： 2017-09-26
上传用户：cuibaigao
Commoditization is a serious threat to the telecommunications industry. Most CSPs offer similar services at rates designed to win what has become a price war. As a result, many face decreasing margins and difficulty sustaining differentiation based on prices or products alone. On top of commoditization, CSPs also face competition from OTT providers and an increasingly knowledgeable and demanding customer base. With access to growing amounts of data from an ever-increasing number of sources and devices, today’s empowered, savvy consumers know what they want and expect to get it.
标签： RestoringConnections_IBM_CPL
上传时间： 2020-06-01
上传用户：shancjb
As we enter the next millennium, there are clear technological patterns. First, the electronic industry continues to scale microelectronic structures to achieve faster devices, new devices, or more per unit area. Secondly, electrostatic charge, electrostatic discharge (ESD), electrical overstress (EOS) and electromagnetic emissions (EMI) continue to be a threat to these scaled structures. This dichotomy presents a dilemma for the scaling of semiconductor technologies and a future threat to new technologies. Technological advancements, material changes, design techniques, and simulation can fend off this growing concern – but to maintain this ever-threatening challenge, one must continue to establish research and education in this issue.
标签： ESD-Phenomena-and-the-Reliability
上传时间： 2020-06-05
上传用户：shancjb
