universal ic tester using 89c51 only one
标签： universal tester 89c51 using
上传时间： 2017-04-18
上传用户：佳期如梦
A class on for undirected graphs. tester is available
标签： undirected available tester graphs
上传时间： 2013-12-12
上传用户：CHINA526
89c51 ic tester 89c51 ic tester
上传时间： 2014-01-03
上传用户：talenthn
ic tester 1 ic tester 1 ic tester 1
上传时间： 2013-12-25
上传用户：稀世之宝039
J2EE tester 测试器是一款用于测试发布于服务器端（如Weblogic, Websphere）的 EJB组件、Servlet以及 Beans的黑盒/白盒智能化测试工具。它的功能主要有以下三点： 1. 自动生成被测试类的覆盖度测试报告，生成相应的dmp文件。 2. 自动生成被测试类的出错报告，记录抛错的行数，出错类型,方法名称，时间以及该行的代码。 3. 按照需要在发生错误的行产生断点，让测试者查看此时各个变量的状态。
标签： Websphere Weblogic Servlet tester
上传时间： 2017-06-01
上传用户：franktu
perl tester to steam character sequence. formats it into lines
标签： character sequence formats tester
上传时间： 2017-08-18
上传用户：维子哥哥
READING CODE tester
上传时间： 2014-10-30
上传用户：佳期如梦
rs 232 tester program
上传时间： 2013-12-17
上传用户：253189838
利用单片机具有的智能程序控制的特点，设计了基于STC89C52单片机的"二极管特性测试器"，可对二极管一般特性进行快速测试。通过稳定线性电流源给二极管加载恒定电流，然后由高精度模数转换器测试其压降，以此为基础可判断二极管好坏、检测二极管极性和测试二极管伏安特性等，避免了用万用表测试只能测得极性而不知其特性这一缺点。可用于电子设计制作过程中对二极管进行快速测试，以确定被测二极管是否满足电路的设计要求。 Abstract: By making good use of the intelligent control function of the Micro Controller Unit (MCU)， the diode trait tester was designed based on the STC89C52，which could be used to test the trait of a diode rapidly. By loading constant current to diode through the stable linear current source， and measuring the voltage drop of the diode by high-precision analogue-to-digital converter (ADC)， it can judge whether the diode is good or not， distinguish the polarity of the diode， and test the trait that the diode， which can avoid the fault of using a multimeter can only measure the polarity but not the trait. This device can be used to test the trait of a diode quickly，and to make sure that whether a diode can be used in the electronic design or not.
上传时间： 2013-11-13
上传用户：assef
Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test. Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.
上传时间： 2013-11-17
上传用户：xiaozhiqban
