Photodiodes can be broken into two categories: largearea photodiodes with their attendant high capacitance(30pF to 3000pF) and smaller area photodiodes withrelatively low capacitance (10pF or less). For optimalsignal-to-noise performance, a transimpedance amplifi erconsisting of an inverting op amp and a feedback resistoris most commonly used to convert the photodiode currentinto voltage. In low noise amplifi er design, large areaphotodiode amplifi ers require more attention to reducingop amp input voltage noise, while small area photodiodeamplifi ers require more attention to reducing op amp inputcurrent noise and parasitic capacitances.
上传时间： 2013-10-28
上传用户：hanbeidang
Most circuit designers are familiar with diode dynamiccharacteristics such as charge storage, voltage dependentcapacitance and reverse recovery time. Less commonlyacknowledged and manufacturer specifi ed is diode forwardturn-on time. This parameter describes the timerequired for a diode to turn on and clamp at its forwardvoltage drop. Historically, this extremely short time, unitsof nanoseconds, has been so small that user and vendoralike have essentially ignored it. It is rarely discussed andalmost never specifi ed. Recently, switching regulator clockrate and transition time have become faster, making diodeturn-on time a critical issue. Increased clock rates aremandated to achieve smaller magnetics size; decreasedtransition times somewhat aid overall effi ciency but areprincipally needed to minimize IC heat rise. At clock speedsbeyond about 1MHz, transition time losses are the primarysource of die heating.
上传时间： 2013-10-10
上传用户：谁偷了我的麦兜
Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.
标签： Converters Defini DAC
上传时间： 2013-10-30
上传用户：stvnash
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上传时间： 2013-11-12
上传用户：pans0ul
数字与模拟电路设计技巧IC与LSI的功能大幅提升使得高压电路与电力电路除外，几乎所有的电路都是由半导体组件所构成，虽然半导体组件高速、高频化时会有EMI的困扰，不过为了充分发挥半导体组件应有的性能，电路板设计与封装技术仍具有决定性的影响。 模拟与数字技术的融合由于IC与LSI半导体本身的高速化，同时为了使机器达到正常动作的目的，因此技术上的跨越竞争越来越激烈。虽然构成系统的电路未必有clock设计，但是毫无疑问的是系统的可靠度是建立在电子组件的选用、封装技术、电路设计与成本，以及如何防止噪讯的产生与噪讯外漏等综合考虑。机器小型化、高速化、多功能化使得低频/高频、大功率信号/小功率信号、高输出阻抗/低输出阻抗、大电流/小电流、模拟/数字电路，经常出现在同一个高封装密度电路板，设计者身处如此的环境必需面对前所未有的设计思维挑战，例如高稳定性电路与吵杂(noisy)性电路为邻时，如果未将噪讯入侵高稳定性电路的对策视为设计重点，事后反复的设计变更往往成为无解的梦魇。模拟电路与高速数字电路混合设计也是如此，假设微小模拟信号增幅后再将full scale 5V的模拟信号，利用10bit A/D转换器转换成数字信号，由于分割幅宽祇有4.9mV，因此要正确读取该电压level并非易事，结果造成10bit以上的A/D转换器面临无法顺利运作的窘境。另一典型实例是使用示波器量测某数字电路基板两点相隔10cm的ground电位，理论上ground电位应该是零，然而实际上却可观测到4.9mV数倍甚至数十倍的脉冲噪讯(pulse noise)，如果该电位差是由模拟与数字混合电路的grand所造成的话，要测得4.9 mV的信号根本是不可能的事情，也就是说为了使模拟与数字混合电路顺利动作，必需在封装与电路设计有相对的对策，尤其是数字电路switching时，ground vance noise不会入侵analogue ground的防护对策，同时还需充分检讨各电路产生的电流回路(route)与电流大小，依此结果排除各种可能的干扰因素。以上介绍的实例都是设计模拟与数字混合电路时经常遇到的瓶颈，如果是设计12bit以上A/D转换器时，它的困难度会更加复杂。
上传时间： 2013-11-16
上传用户：731140412
半導體的產品很多，應用的場合非常廣泛，圖一是常見的幾種半導體元件外型。半導體元件一般是以接腳形式或外型來劃分類別，圖一中不同類別的英文縮寫名稱原文為 PDID：Plastic Dual Inline Package SOP：Small Outline Package SOJ：Small Outline J-Lead Package PLCC：Plastic Leaded Chip Carrier QFP：Quad Flat Package PGA：Pin Grid Array BGA：Ball Grid Array 雖然半導體元件的外型種類很多，在電路板上常用的組裝方式有二種，一種是插入電路板的銲孔或腳座，如PDIP、PGA，另一種是貼附在電路板表面的銲墊上，如SOP、SOJ、PLCC、QFP、BGA。 從半導體元件的外觀，只看到從包覆的膠體或陶瓷中伸出的接腳，而半導體元件真正的的核心，是包覆在膠體或陶瓷內一片非常小的晶片，透過伸出的接腳與外部做資訊傳輸。圖二是一片EPROM元件，從上方的玻璃窗可看到內部的晶片，圖三是以顯微鏡將內部的晶片放大，可以看到晶片以多條銲線連接四周的接腳，這些接腳向外延伸並穿出膠體，成為晶片與外界通訊的道路。請注意圖三中有一條銲線從中斷裂，那是使用不當引發過電流而燒毀，致使晶片失去功能，這也是一般晶片遭到損毀而失效的原因之一。 圖四是常見的LED，也就是發光二極體，其內部也是一顆晶片，圖五是以顯微鏡正視LED的頂端，可從透明的膠體中隱約的看到一片方型的晶片及一條金色的銲線，若以LED二支接腳的極性來做分別，晶片是貼附在負極的腳上，經由銲線連接正極的腳。當LED通過正向電流時，晶片會發光而使LED發亮，如圖六所示。 半導體元件的製作分成兩段的製造程序，前一段是先製造元件的核心─晶片，稱為晶圓製造；後一段是將晶中片加以封裝成最後產品，稱為IC封裝製程，又可細分成晶圓切割、黏晶、銲線、封膠、印字、剪切成型等加工步驟，在本章節中將簡介這兩段的製造程序。
上传时间： 2014-01-20
上传用户：苍山观海
Linear Technology’s high performance battery management ICsenable long battery life and run time, while providing precision charging control, constantstatus monitoring and stringent battery protection. Our proprietary design techniques seamlesslymanage multiple input sources while providing small solution footprints, faster charging and100% standalone operation. Battery and circuit protection features enable improved thermalperformance and high reliability operation.
上传时间： 2013-10-13
上传用户：yyq123456789
精确度0.05%满刻度±1位数（Accuracy 0.05%F.S.±1digit） 可测量交直流电流/交直流电压/电位计/传送器/Pt-100/荷重元/电阻等信号（Measuring DCA/DCV/ACA/ACV/Potentiometer/Transmitter/Pt-100/Load Cell/Resistor/etc……） 显示范围0-19999可任意规划（Programmable rate 0 to 1999 digit） 小数点可任意规划（Decimal point can be modified） 尺寸小，稳定性高（Dimension small & High stability）
上传时间： 2014-01-25
上传用户：RQB123
特点（FEATURES） 精确度0.1%满刻度（Accuracy 0.1%F.S.） 多种输入输出选择（Wide selection of input/output range） 三线式接线自动补偿线路阻抗效应（3 wire configuration automatically compensate line resistance effects） 宽范围交直流两用电源设计（Wide input range for auxiliary power） 尺寸小，稳定性高（Dimension small & High stability）
上传时间： 2013-10-17
上传用户：Huge_Brother
特点（FEATURES） 精确度0.1%满刻度（Accuracy 0.1%F.S.） 宽输入范围200ohm 至 50Kohm（Wide inpuet ranges from 200ohm to 50Kohm） 多种输入输出选择（Wide selection of input/output range） 输入与输出1/输出2绝缘耐压 2仟伏特/1分钟（Dielectric strength 2KVac/1min.（input/output1/output2）） 宽范围交直流两用电源设计（Wide input range for auxiliary power） 尺寸小，稳定性高（Dimension small & High stability）
上传时间： 2013-10-28
上传用户：sardinescn
