虫虫首页| 资源下载| 资源专辑| 精品软件
登录| 注册

electrom

  • It was proposed that perfect invisibility cloaks can be constructed for hiding objects from electrom

    It was proposed that perfect invisibility cloaks can be constructed for hiding objects from electromagnetic illumination (Pendry et al., Science 312, p. 1780). The cylindrical cloaks experimentally demonstrated (Schurig et al., Science 314, p. 997) and theoretically proposed (Cai et al., Nat. Photon. 1, p. 224) have however simplified material parameters in order to facilitate easier realization as well as to avoid infinities in optical constants. Here we show that the cylindrical cloaks with simplified material parameters inherently allow the zeroth-order cylindrical wave to pass through the cloak as if the cloak is made of a homogeneous isotropic medium, and thus visible. To all high-order cylindrical waves, our numerical simulation suggests that the simplified cloak inherits some properties of the ideal cloak, but finite scatterings exist.

    标签: invisibility constructed proposed electrom

    上传时间: 2013-12-18

    上传用户:13215175592

  • IGBT失效分析技术

    近年来,对器件的失效分析已经成为电力电子领域中一个研究热点。本论文基于现代电力电子装置中应用最广的IGBT器件,利用静态测试仪3716,SEM(Scanning electrom Microscope,扫描电子显微镜)、EDX(Energy Dispersive X-Ray Spectroscopy、能量色散x射线光谱仪)、FIB(Focused lon beam,聚焦高子束)切割、TEM(Thermal Emmision Microscope,高精度热成像分析仪)等多种分析手段对模块应用当中失效的1GBT芯片进行电特性分析、芯片解剖并完成失效分析,并基于相应的失效模式提出了封装改进方案。1,对于栅极失效的情况,本论文先经过电特性测试完成预分析,并利用THEMOS分析出栅极漏电流通路,找到最小点并进行失效原因分析,针对相应原因提出改进方案。2,针对开通与关断瞬态过电流失效,采用研磨、划片等手段进行芯片的解剖。并用SEM与EDX对芯片损伤程度进行评估分析,以文献为参考进行失效原因分析,利用saber仿真进行失效原因验证。3,针对通态过电流失效模式,采用解剖分析来评估损伤情况,探究失效原因,并采用电感钳位电路进行实验验证。4,针对过电压失效模式,采用芯片解剖方式来分析失效点以及失效情况,基于文献归纳并总结出传统失效原因,并通过大量实验得出基于封装的失效原因,最后采用saber仿真加以验证。

    标签: igbt

    上传时间: 2022-06-21

    上传用户:1208020161