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  • truetable

    真实表格,把cad里的表格到excell中,非常简单适用。

    标签: truetable

    上传时间: 2019-07-20

    上传用户:15367819610

  • GIS-用地适宜性评价

    本文在分析 CAD 文件格式与 GIS 所需建模源文件之间差异性的基础上,介绍了数据的自动转 换获取方法,说明了 GIS 用于城市用地适宜性评价的具体操作流程,并对 GIS 在城市规划其他方面的应用 进行了展望。

    标签: GIS

    上传时间: 2020-04-13

    上传用户:小婷婷婷

  • Introduction+to+RF+Propagation

    With the rapid expansion of wireless consumer products,there has been a con- siderable increase in the need for radio-frequency (RF) planning, link plan- ning, and propagation modeling.A network designer with no RF background may find himself/herself designing a wireless network. A wide array of RF planning software packages can provide some support, but there is no substi- tute for a fundamental understanding of the propagation process and the lim- itations of the models employed. Blind use of computer-aided design (CAD) programs with no understanding of the physical fundamentals underlying the process can be a recipe for disaster. Having witnessed the results of this approach, I hope to spare others this frustration.

    标签: Introduction Propagation to RF

    上传时间: 2020-05-27

    上传用户:shancjb

  • Wireless+Communication+Circuits+and+Systems

    This book is concerned with integrated circuits and systems for wireless and mobile communications. Circuit techniques and implementation of reconfigurable low-voltage and low-power single-chip CMOS transceivers for multiband and multi- mode universal wireless communications are the focus of the book. Applications encompass both long-range mobile cellular communications (GSM and UMTS) and short-range wireless LANs (IEEE802.11 and Bluetooth). Recent advances in research into transceiver architecture, RF frontend, analogue baseband, RF CAD and automatic testing are reported. 

    标签: Communication Wireless Circuits Systems and

    上传时间: 2020-06-01

    上传用户:shancjb

  • ESD - Failure Mechanisms and Models

    Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and electrical overstress (EOS) protection design and development [1–8]. In the failure analysis of EOS, ESD, and latchup events, there are a number of unique failure analysis processes andinformationthatcanprovidesignificantunderstandingandillumination[4].Today,thereis still no design methodology or computer-aided design (CAD) tool which will predict EOS, ESDprotectionlevels,andlatchupinasemiconductorchip;thisisoneofthesignificantreasons why failure analysis is critical to the ESD design discipline.

    标签: Mechanisms Failure Models ESD and

    上传时间: 2020-06-05

    上传用户:shancjb

  • cad4级题目

    电子cad四级考证题目练习,新手练手用,库可提供

    标签: cad4

    上传时间: 2020-12-15

    上传用户:

  • ad15练习题

    一份AD15的软件练习题,电子cad的四级考试题目。提供给新手练习用

    标签: ad 15

    上传时间: 2020-12-15

    上传用户:

  • dxp15

    一份AD15的软件练习题,电子cad的四级考试题目。提供给新手练习用

    标签: dxp 15

    上传时间: 2020-12-15

    上传用户:

  • 电力杆塔图纸

    各种类杆塔图纸,CAD资源,35kv-110kv铁塔

    标签: 电力 图纸

    上传时间: 2021-01-13

    上传用户:

  • SX126X CAD performance evaluation

    Semtech SX126X系列Lora芯片相关参数文档

    标签: SX126X CAD Lora芯片

    上传时间: 2021-11-28

    上传用户: