压缩包中有5篇论文，分别为《Data-driven analysis of variables and dependencies in continuous optimization problems and EDAs》这是一篇博士论文，较为详细的介绍了各种EDA算法；《Anisotropic adaptive variance Scaling for Gaussian estimation of distribution algorithm》《Enhancing Gaussian Estimation of Distribution Algorithm by Exploiting Evolution Direction with Archive》《Niching an Archive-based Gaussian Estimation of Distribution Algorithm via Adaptive Clustering》《Supplementary material for Enhancing Gaussian Estimation of Distribution Algorithm by Exploiting Evolution Direction with Archive》《基于一般二阶混合矩的高斯分布估计算法》介绍了一些基于EDA的创新算法。
上传时间： 2020-05-25
上传用户：duwenhao
As we enter the next millennium, there are clear technological patterns. First, the electronic industry continues to scale microelectronic structures to achieve faster devices, new devices, or more per unit area. Secondly, electrostatic charge, electrostatic discharge (ESD), electrical overstress (EOS) and electromagnetic emissions (EMI) continue to be a threat to these scaled structures. This dichotomy presents a dilemma for the Scaling of semiconductor technologies and a future threat to new technologies. Technological advancements, material changes, design techniques, and simulation can fend off this growing concern – but to maintain this ever-threatening challenge, one must continue to establish research and education in this issue.
标签： ESD-Phenomena-and-the-Reliability
上传时间： 2020-06-05
上传用户：shancjb
Design for manufacturability and statistical design encompass a number of activities and areas of study spanning the integrated circuit design and manufacturing worlds. In the early days of the planar integrated circuit, it was typical for a handful of practitioners working on a particular design to have a fairly complete understanding of the manufacturing process, the resulting semiconductor active and passive devices, as well as the resulting circuit - often composed of as few as tens of devices. With the success of semiconductor Scaling, predicted and - to a certain extent even driven - by Moore’s law, and the vastly increased complexity of modern nano-meter scale processes and the billion-device circuits they allow, there came a necessary separation between the various disciplines.
标签： Manufacturability Statistical Design for and
上传时间： 2020-06-10
上传用户：shancjb
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上传时间： 2021-10-22
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