Abstract: With the large number of analog switches on the market today, there are many performance criteria for a product designer to consider. This application note reviews the basic construction of
上传时间： 2013-11-09
上传用户：xiaohanhaowei
Abstract: Using a DAC and a microprocessor supervisor, the system safety can be improved in industrial controllers, programmablelogiccontrollers (PLC), and data-acquisition systems. The analog output is set to zero-scale (or pin-programmable midscale) when amicroprocessor failure, optocoupler failure, or undervoltage condition occurs. A simple application is shown on how to implement thisfunction.
上传时间： 2013-10-17
上传用户：sjb555
The LT®6552 is a specialized dual-differencing 75MHzoperational amplifier ideal for rejecting common modenoise as a video line receiver. The input pairs are designedto operate with equal but opposite large-signal differencesand provide exceptional high frequency commonmode rejection (CMRR of 65dB at 10MHz), therebyforming an extremely versatile gain block structure thatminimizes component count in most situations. The dualinput pairs are free to take on independent common modelevels, while the two voltage differentials are summedinternally to form a net input signal.
上传时间： 2014-12-23
上传用户：13691535575
Photodiodes can be broken into two categories: largearea photodiodes with their attendant high capacitance(30pF to 3000pF) and smaller area photodiodes withrelatively low capacitance (10pF or less). For optimalsignal-to-noise performance, a transimpedance amplifi erconsisting of an inverting op amp and a feedback resistoris most commonly used to convert the photodiode currentinto voltage. In low noise amplifi er design, large areaphotodiode amplifi ers require more attention to reducingop amp input voltage noise, while small area photodiodeamplifi ers require more attention to reducing op amp inputcurrent noise and parasitic capacitances.
上传时间： 2013-10-28
上传用户：hanbeidang
One of the most critical components in a step-up design like Figure 1 is the transformer. Transformers have parasitic components that can cause them to deviate from their ideal characteristics, and the parasitic capacitance associated with the secondary can cause large resonating current spikes on the leading edge of the switch current waveform.
上传时间： 2013-11-22
上传用户：15070202241
Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.
标签： Converters Defini DAC
上传时间： 2013-10-30
上传用户：stvnash
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上传时间： 2013-11-12
上传用户：pans0ul
Power conversion by virtue of its basic role produces harmonics due to theslicing of either voltages or currents. To a large extent the pollution in theutility supply and the deterioration of the power quality has been generatedor created by non-linear converters. It is therefore ironic that power convertersshould now be used to clean up the pollution that they helped to create inthe first place.In a utility system, it is desirable to prevent harmonic currents (which resultin EMI and resonance problems) and limit reactive power flows (whichresult in transmission losses).Traditionally, shunt passive filters, comprised of tuned LC elements andcapacitor banks, were used to filter the harmonics and to compensate forreactive current due to non-linear loads. However, in practical applicationsthese methods have many disadvantages.
上传时间： 2013-11-05
上传用户：AISINI005
Abstract: Large steel buildings, automobiles, mountains, even people survive real atmospheric lightning.
上传时间： 2013-11-11
上传用户：zgu489
数字与模拟电路设计技巧IC与LSI的功能大幅提升使得高压电路与电力电路除外，几乎所有的电路都是由半导体组件所构成，虽然半导体组件高速、高频化时会有EMI的困扰，不过为了充分发挥半导体组件应有的性能，电路板设计与封装技术仍具有决定性的影响。 模拟与数字技术的融合由于IC与LSI半导体本身的高速化，同时为了使机器达到正常动作的目的，因此技术上的跨越竞争越来越激烈。虽然构成系统的电路未必有clock设计，但是毫无疑问的是系统的可靠度是建立在电子组件的选用、封装技术、电路设计与成本，以及如何防止噪讯的产生与噪讯外漏等综合考虑。机器小型化、高速化、多功能化使得低频/高频、大功率信号/小功率信号、高输出阻抗/低输出阻抗、大电流/小电流、模拟/数字电路，经常出现在同一个高封装密度电路板，设计者身处如此的环境必需面对前所未有的设计思维挑战，例如高稳定性电路与吵杂(noisy)性电路为邻时，如果未将噪讯入侵高稳定性电路的对策视为设计重点，事后反复的设计变更往往成为无解的梦魇。模拟电路与高速数字电路混合设计也是如此，假设微小模拟信号增幅后再将full scale 5V的模拟信号，利用10bit A/D转换器转换成数字信号，由于分割幅宽祇有4.9mV，因此要正确读取该电压level并非易事，结果造成10bit以上的A/D转换器面临无法顺利运作的窘境。另一典型实例是使用示波器量测某数字电路基板两点相隔10cm的ground电位，理论上ground电位应该是零，然而实际上却可观测到4.9mV数倍甚至数十倍的脉冲噪讯(pulse noise)，如果该电位差是由模拟与数字混合电路的grand所造成的话，要测得4.9 mV的信号根本是不可能的事情，也就是说为了使模拟与数字混合电路顺利动作，必需在封装与电路设计有相对的对策，尤其是数字电路switching时，ground vance noise不会入侵analogue ground的防护对策，同时还需充分检讨各电路产生的电流回路(route)与电流大小，依此结果排除各种可能的干扰因素。以上介绍的实例都是设计模拟与数字混合电路时经常遇到的瓶颈，如果是设计12bit以上A/D转换器时，它的困难度会更加复杂。
上传时间： 2013-11-16
上传用户：731140412
