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ElectroStatic

  • ESD-Phenomena-and-the-Reliability

    As we enter the next millennium, there are clear technological patterns. First, the electronic industry continues to scale microelectronic structures to achieve faster devices, new devices, or more per unit area. Secondly, ElectroStatic charge, ElectroStatic discharge (ESD), electrical overstress (EOS) and electromagnetic emissions (EMI) continue to be a threat to these scaled structures. This dichotomy presents a dilemma for the scaling of semiconductor technologies and a future threat to new technologies. Technological advancements, material changes, design techniques, and simulation can fend off this growing concern – but to maintain this ever-threatening challenge, one must continue to establish research and education in this issue. 

    标签: ESD-Phenomena-and-the-Reliability

    上传时间: 2020-06-05

    上传用户:shancjb

  • 静电放电ESD保护器件的模拟与仿真

    静电放电(ElectroStatic Discharge,ESD)是构成集成电路可靠性的主要因素之一,存在于生产到使用的每一个环节,并成为开发新一代工艺技术的难点之一,近年来,对ESD的研究也因而越来越受到重视,仿真工具在ESD领域的应用使得ESD防护的研究变得更为便利,可大幅缩短研发周期然而,由于ESD现象复杂的物理机制,极端的电场及温度条件,以及ESD仿真中频繁的不收敛现象,都使得FSD的仿真变得极为困难本文详细阐述了ESD的来源、造成的危害以及如何测试集成电路的防静电冲击能力,并基于 Sentaurus软件,对ESD防护器件展开了的分析、研究,内容包括1)掌握ESD保护的基本理论、测试方法和防护机理2)研究了工艺仿真流程的步骤以及网格定义在工艺仿真中的重要性,并对网格定义的方法进行了探讨3)硏究了器件仿真流程以及器件仿真中的物理模型和模型函数,并对描述同一物理机制的的各种不同模型展开对比分析.主要包括传输方程模型、能帶模型、各种迁移率退化模型、雪崩离化模型和复合模型4)研究了双极型晶体管和可控硅(Silicon Controlled rectifier,SCR)防护器件的仿真,并通过对仿真结果的分析,研究了ESD保护器件在ESD应力作用下的工作机理关键词:静电放电;网格;器件仿真;双极型晶体管;可控硅

    标签: 静电放电 esd

    上传时间: 2022-03-30

    上传用户:

  • IEC 61000-4-2-2018

    INTERNATIONAL STANDARD NORME INTERNATIONALEPart 4-2: Testing and measurement techniques – ElectroStatic discharge immunity test.About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published.

    标签: IEC

    上传时间: 2022-04-19

    上传用户:fliang