读取STM32芯片内部唯一的标识，用于加密等区别其他芯片的操作，有完整注释，测试通过-STM32 chip to read a unique identifier for the encryption and other differences other chip operation, with complete notes, Test
上传时间： 2013-05-24
上传用户：793212294
在软件Proteus中仿真ucos（ARM）\r\n1.移植除了OS_CPU.h,OS_CPU_A.s,OS_CPU_C.C 三个函数外，对中断专门用了一个函数OS_int_A.s 按其中的规则写中断函数即可. \r\n2。应用实例为\\ArmUCOS\\App\\test1\\test.mcp,在周立功2104的板子上的ram中就可直接运行(code＋data
上传时间： 2013-09-30
上传用户：s363994250
微弱信号检测装置 四川理工学院 刘鹏飞、梁天德、曾学明 摘要： 本设计以TI的Launch Pad为核心板，采用锁相放大技术设计并制作了一套微弱信号检测装置，用以检测在强噪声背景下已知频率微弱正弦波信号的幅度值，并在液晶屏上数字显示出所测信号相应的幅度值。实验结果显示其抗干扰能力强，测量精度高。 关键词：强噪声；微弱信号；锁相放大；Launch Pad Abstract: This design is based on the Launch Pad of TI core board, using a lock-in amplifier technique designed and produced a weak signal detection device, to measure the known frequency sine wave signal amplitude values of the weak in the high noise background, and shows the measured signal amplitude of the corresponding value in the liquid crystal screen. Test results showed that it has high accuracy and strong anti-jamming capability. Keywords: weak signal detection; lock-in-amplifier; Launch Pad 1、引言 随着现代科学技术的发展，在科研与生产过程中人们越来越需要从复杂高强度的噪声中检测出有用的微弱信号，因此对微弱信号的检测成为当前科研的热点。微弱信号并不意味着信号幅度小，而是指被噪声淹没的信号，“微弱”也仅是相对于噪声而言的。只有在有效抑制噪声的条件下有选择的放大微弱信号的幅度，才能提取出有用信号。微弱信号检测技术的应用相当广泛，在生物医学、光学、电学、材料科学等相关领域显得愈发重要。 2、方案论证 针对微弱信号的检测的方法有很多，比如滤波法、取样积分器、锁相放大器等。下面就针对这几种方法做一简要说明。 方案一：滤波法。 在大部分的检测仪器中都要用到滤波方法对模拟信号进行一定的处理，例如隔离直流分量，改善信号波形，防止离散化时的波形混叠，克服噪声的不利影响，提高信噪比等。常用的噪声滤波器有：带通、带阻、高通、低通等。但是滤波方法检测信号不能用于信号频谱与噪声频谱重叠的情况，有其局限性。虽然可以对滤波器的通频带进行调节，但其噪声抑制能力有限，同时其准确性与稳定性将大打折扣。
上传时间： 2013-11-04
上传用户：lty6899826
Maxim Analog Essentials are a series of plug-in peripheral modules that allow engineers to quickly Test, evaluate, and integrate Maxim components into their hardware/software designs. The modules electrically and physically conform to the Digilent Pmod™ interface specification and are compatible with any Digilent Pmod-compatible header.
标签： 模拟技术
上传时间： 2013-11-14
上传用户：ljj722
Precision 16-bit analog outputs with softwareconfigurableoutput ranges are often needed in industrialprocess control equipment, analytical and scientificinstruments and automatic Test equipment. In the past,designing a universal output module was a daunting taskand the cost and PCB real estate associated with thisfunction were problematic, if not prohibitive.
上传时间： 2014-12-23
上传用户：如果你也听说
Digital-to-analog converters (DACs) are prevalent inindustrial control and automated Test applications.General-purpose automated Test equipment often requiresmany channels of precisely controlled voltagesthat span several voltage ranges. The LTC2704 is ahighly integrated 16-bit, 4-channel DAC for high-endapplications. It has a wide range of features designed toincrease performance and simplify design.
上传时间： 2013-11-22
上传用户：元宵汉堡包
A complete design for a data acquisition card for the IBM PC is detailed in this application note. Additionally, C language code is provided to allow sampling of data at speed of more than 20kHz. The speed limitation is strictly based on the execution speed of the "C" data acquisition loop. A "Turbo" XT can acquire data at speeds greater than 20kHz. Machines with 80286 and 80386 processors can go faster than 20kHz. The computer that was used as a Test bed in this application was an XT running at 4.77MHz and therefore all system timing and acquisition time measurements are based on a 4.77MHz clock speed.
上传时间： 2013-10-29
上传用户：BOBOniu
Low power operation of electronic apparatus has becomeincreasingly desirable. Medical, remote data acquisition,power monitoring and other applications are good candidatesfor battery driven, low power operation. Micropoweranalog circuits for transducer-based signal conditioningpresent a special class of problems. Although micropowerICs are available, the interconnection of these devices toform a functioning micropower circuit requires care. (SeeBox Sections, “Some Guidelines for Micropower Designand an Example” and “Parasitic Effects of Test Equipmenton Micropower Circuits.”) In particular, trade-offs betweensignal levels and power dissipation become painful whenperformance in the 10-bit to 12-bit area is desirable.
上传时间： 2013-10-22
上传用户：rocketrevenge
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上传时间： 2013-11-12
上传用户：pans0ul
随着科学技术的不断发展，人们的生活水平的不断提高，通信技术的不断扩延，计算机已经涉及到各个不同的行业，成为人们生活、工作、学习、娱乐不可缺少的工具。而计算机主板作为计算机中非常重要的核心部件，其品质的好坏直接影响计算机整体品质的高低。因此在生产主板的过程中每一步都是要严格把关的，不能有丝毫的懈怠，这样才能使其品质得到保证。 基于此，本文主要介绍电脑主板的SMT生产工艺流程和F/T(Function Test)功能测试步骤（F/T测试步骤以惠普H310机种为例）。让大家了解一下完整的计算机主板是如何制成的，都要经过哪些工序以及如何检测产品质量的。 本文首先简单介绍了PCB板的发展历史，分类，功能及发展趋势，SMT及SMT产品制造系统，然后重点介绍了SMT生产工艺流程和F/T测试步骤。
上传时间： 2013-11-06
上传用户：paladin
