Construction Strategy of ESD P

资 源 简 介

Construction Strategy of ESD Protection Circuit
Abstract： The principles used to construct ESD protection on circuits and the basic concept
ions of ESD protection design are presented.
Key words：ESD protection/On circuit, ESD design window, ESD current path
1 引言
静电放电（ESD，Electrostatic Discharge）给电子器件环境会带来破坏性的后果。
它是造成集成电路失效的主要原因之一。随着集成电路工艺不断发展，互补金属氧化物半
导体（CMOS，Complementary Metal-Oxide Semiconductor）的特征尺寸不断缩小，
金属氧化物半导体(MOS, Metal-Oxide Semiconductor)的栅氧厚度越来越薄，MOS 管
能承受的电流和电压也越来越小，因此要进一步优化电路的抗ESD 性能，需要从全芯片
ESD 保护结构的设计来进行考虑。

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